{"code":"C17754","name":"Atomic Force Microscopy","terminology":"ncit","version":"26.09d","conceptStatus":"DEFAULT","leaf":true,"active":true,"synonyms":[{"name":"Atomic Force Microscopy","termType":"PT","type":"FULL_SYN","typeCode":"P90","source":"NCI"},{"name":"Scanning Force Microscopy","termType":"SY","type":"FULL_SYN","typeCode":"P90","source":"NCI"},{"name":"Atomic Force Microscopy","type":"Preferred_Name","typeCode":"P108"}],"definitions":[{"definition":"A technique utilizing a scanning probe to image and analyze the surface of a material with atomic-level resolution.","code":"P97","type":"DEFINITION","source":"NCI"}],"properties":[{"code":"P366","type":"Legacy Concept Name","value":"Atomic_Force_Microscopy"},{"code":"P106","type":"Semantic_Type","value":"Laboratory Procedure"},{"code":"P207","type":"UMLS_CUI","value":"C0242849"}]}